Coulomb blockade in microscopic material defects as a source of decoherence and noise in solid-state quantum circuits
📄 arXiv:2607.15252 · 📥 PDF · 2026-07-16 · quant-ph
Authors: R. Banerjee [arXiv · scholar] , L. P. Lindoy [arXiv · scholar] , M. Hegedus [arXiv · scholar] , A. Hutcheson [arXiv · scholar] , T. Hawkins [arXiv · scholar] , E. Daghigh-Ahmadi [arXiv · scholar] , S. Samaddar [arXiv · scholar] , T. Barker [arXiv · scholar] , J. P. Goff [arXiv · scholar] , A. Ya. Tzalenchuk [arXiv · scholar] , I. Rungger [arXiv · scholar] , S. E. de Graaf [arXiv · scholar]
🕰 Orloj analysis
Tento článek identifikuje nový mechanismus dekoherence v supravodivých kvantových obvodech, způsobený Coulombovou blokádou a mikrovlnným tunelováním náboje v kovových zrnech. Tyto defekty jsou stejně rozšířené a škodlivé jako TLS defekty, ale mají odlišný fyzikální původ, a jejich eliminace nabízí cestu ke zlepšení koherence.
💡 Práce představuje významný objev nového mechanismu dekoherence, který zpochybňuje stávající chápání limitů koherence a nabízí praktické řešení pro zlepšení kvantových zařízení.
✓ falsifiable, modest_claims
📄 Abstract
A critical limitation of solid-state quantum devices arises from the materials from which they are fabricated: uncontrolled surfaces, interfaces, and structural imperfections introduce numerous sources of loss and decoherence. Despite extensive efforts, linking these decoherence mechanisms to their microscopic material origins -- essential for developing effective mitigation strategies -- remains an outstanding challenge that has slowed coherence improvements. Here, using scanning gate microscopy on live superconducting circuits we identify a previously unrecognised decoherence mechanism originating from Coulomb blockade and microwave-driven charge tunnelling in metallic grains. Such grains are ubiquitous in thin-film devices fabricated by standard lithography processes. By characterising multiple defects across different devices, we find such defects to be as common and as debilitating to device performance as two-level system (TLS) defects, while originating from a fundamentally different physical mechanism. Importantly, conventional characterisation techniques would misattribute this loss to other, microwave power-independent processes. Our observations thus reveal a widespread source of decoherence in superconducting circuits, challenging the prevailing paradigm that coherence lifetimes are primarily limited by TLS defects. Eliminating metallic grains during fabrication provides a clear and practical route to suppress this mechanism, offering a pathway towards improved coherence and reduced noise in microwave-based solid-state quantum devices.