Foundry CMOS platform for multimodal quantum materials characterization
📄 arXiv:2607.18059 · 📥 PDF · 2026-07-20 · quant-ph
Authors: Sharad Kumar Yadav [arXiv · scholar] , Luca Nessi [arXiv · scholar] , Ondrej Dyck [arXiv · scholar] , Jinchen Wang [arXiv · scholar] , Bogdan Dryzhakov [arXiv · scholar] , Alex Melendez [arXiv · scholar] , Huan Zhao [arXiv · scholar] , Qian Song [arXiv · scholar] , Doha Amer [arXiv · scholar] , Cole Brabec [arXiv · scholar] , Saleh Alqazlan [arXiv · scholar] , Ruonan Han [arXiv · scholar] , Riccardo Comin [arXiv · scholar] , Stephen Jesse [arXiv · scholar] , Dirk Englund [arXiv · scholar] , Jawaher Almutlaq [arXiv · scholar]
🕰 Orloj analysis
Tento článek popisuje, jak lze komerční 65nm CMOS proces využít jako pasivní, továrně vyrobitelnou platformu pro multimodální charakterizaci kvantových materiálů. Integrovaná architektura umožňuje kryogenní měření magnetické susceptibility a opticky detekovanou magnetickou rezonanci (ODMR) s výrazně sníženými energetickými nároky a kompatibilitou s elektronovou mikroskopií.
💡 Jde o významný inženýrský pokrok v oblasti charakterizace kvantových materiálů, který nabízí praktické řešení pro škálovatelnost a reprodukovatelnost, aniž by se zabýval novou fundamentální fyzikou.
✓ falsifiable, modest_claims
⚠ lack of explicit error bars in abstract for all metrics, vague quantification of 'no measurable degradation'
📄 Abstract
Quantum materials experiments increasingly rely on microwave, electrical, thermal, optical, and structural probes, but these capabilities are typically assembled from custom hardware that limits reproducibility and scalability. Here we show that a commercial 65-nm CMOS process can be repurposed as a passive, foundry-manufacturable characterization platform by functionally partitioning its metal stack into microwave, thermal, and electrical subsystems within a 1 mm2 footprint. The integrated RF architecture enables cryogenic magnetic susceptibility measurements of Fe3GeTe2 heterostructures at 1.75 K without sample-specific fabrication. We further demonstrate NV-center optically detected magnetic resonance (ODMR) with >20% contrast at 4-9 dBm microwave power, reducing power requirements by 20-25 dB relative to conventional antenna-based approaches while maintaining sensitivities of 2-3 uT/sqrt(Hz). We additionally confirm compatibility with in-situ electron-beam imaging, showing no measurable degradation in image quality upon device operation. These results establish a scalable, foundry-manufacturable platform for multimodal quantum sensing and materials characterization.